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MRSEC Shared Instrument Facility

This facility is located on the 10th floor of the Schapiro Center for Engineering and Physical Science Research (CEPSR). Larger instruments are in 10LE4 CEPSR. This facility is equipped with two spectroscopic ellipsometers, two x-ray diffractometers (for powder, small angle and reflectivity measurements), XPS/SIMS/ISS analysis system, and an atomic force microscope. The phone number in this lab is 212-854-0087. Next door, 10LE5 CEPSR, contains a wet station, a clean bench, a Fourier Transform Infrared (FTIR) Spectrometer, UV/VIS spectrophotometer, and a probe station.

For general questions and information about the MRSEC Shared Instrument Facility, please contact Dr. Joze Bevk, Director, Nanotechnology Development.

Spectroscopic and Imaging Ellipsometers
Supervisor: Professor Irving P. Herman

The direct contact for these instruments is Theodore Kramer. Please contact him for scheduling and training information.

A. J.A. Woollam Spectroscopic Ellipsometer (Model:Alpha SE)

Specifications:
- Wavelength range: 380-900nm
- Modes: Transmission (90deg AOI), Refelction (70 deg AOI)
- Spot Size: 1mm diameter in transmission, 1mm x 5mm in reflection mode
- Software: Complete EASE, supplied by J. A. Woolam. Easy to use with intuitive user interface.

B. The Beaglehole Spectroscopic and Imaging System
This instrument can be configured and operated as an:

- Ellipsometer (picometer) in a single region, either monochromatically at 6328 A (He-Ne laser) (10-15 micron spot size) or spectroscopically from 200 - 1050 nm, at variable angle.
- Spectroscopic imaging ellipsometer over 2 mm x 2 mm to 1 cm x 1 cm with a spatial resolution of 3-5 microns, at variable angle.
- Image-enhanced ellipsometer - on dual arms with the picometer and imaging system used at the same time.
- Reflectance Difference Spectrometer (RDS).
- Reflectometer.
- Transmission or transmission ellipsometer. (Systems 1-3 are reflection ellipsometers)
- Circular dichroism/birefringence instrument.
- Scatterometer, for dark field elastic scattering.

X-ray Diffractometers
Supervisor : Dr. Joze Bevk

The direct contact for this instrument is Gen Satoh. Please contact him for scheduling and training information.

Scintag X2 X-ray Diffractometer (right figure)
This is a Scintag Model X2, with powder diffraction, small angle diffraction, and reflectivity capability. It has a high temperature stage, which allows analysis up to 1600oC.

Inel X-ray Diffractometer (right figure)
This diffractometer allows for instantaneous 120 degree (2-theta) detection of x-rays diffracted from substrates and powders, and has a capillary attachment and furnace for dynamic analysis of powder samples from 0 to 400 degrees C.

X-ray Photoelectron Spectrometer (XPS)
Supervisor: Professor Jeffrey Koberstein

Please contact Benjamin Dach for scheduling and training information

PHI 5500 ESCA (XPS)/ISS Spectrometer (right figure)
This is a PHI 5500 ESCA (XPS)/ISS system with a secondary ion mass spectrometer. It is capable of performing ESCA, ESCA mapping, ESCA depth profiling, static SIMS, and ISS, all under computer control. In the ESCA mode, the system can run multiple samples under automatic control. ESCA can be run in either the static mode (analysis of a fixed area) or in a mapping mode.

Atomic Force Microscope (AFM)
Supervisor : Professor Irving Herman

The direct contact for this instrument is Damien Maillard. Please contact him for scheduling and training information.

ThermoMicroscopes Autoprobe CP Research System (right figure)

This is a ThermoMicroscopes Autoprobe CP Research System capable of contact, non-contact, intermittent contact, scanning tunneling microscopy, lateral force microscopy, phase imaging, electrostatic force microscopy and nanolithography modes.

This instrument is also capable of imaging samples under solution.

Fourier Transform Infrared (FTIR) Spectrometer
Supervisor : Professor Irving Herman

The direct contact for this instrument is Theodore Kramer. Please contact him for scheduling and training information.

Digilab/Biorad 7000 Fourier Transform Infrared (FTIR) Spectrometer (right figure)

This is a Digilab/Biorad 7000 FTIR spectrometer with an attachment for variable-angle infrared reflection absorption spectroscopy (IRRAS) using a photoelastic modulator (PEM) with an MCT detector, which can easily measure monolayers and also determine how transitions are polarized. It also has an attenuated total reflection (ATR) attachment.

Probe Station
Supervisor : Professor Irving Herman

The direct contact for this instrument is Austin Akey, who should also be contacted for scheduling and training information.

Signatone Probe Station (right figure)

The Signatone CM300 Probe Station is used for the electronic characterization of semiconductor devices. This particular unit includes 4 micropositioners, and a joystick control system that enables coarse and fine x-y translation of the scope and chuck. The Mitutoyo microscope allows viewing up to 1000x, and includes a frame grabber for capturing digital images. This system may also be used in conjunction with our Radiant Technology Ferroelectric Tester.

UV/Visible Spectrophotometer
Supervisor : Professor Irving Herman

The direct contact for this instrument is Theodore Kramer. Please contact him for scheduling and training information.

HP 8453 UV/Visible Spectrophotometer (right figure)

The HP 8453 UV/Visible Spectrophotometer, by Agilent, is used for concentration analysis of molecular species in aqueous solutions. Transmission and absorbance spectra can be obtained from 190 nm in the UV, throughout the visible range, and up to 1100 nm in the near IR.

Thermogravimetric Analyzer
Supervisor : Professor Irving Herman

The direct contact for this instrument is Theodore Kramer. Please contact him for scheduling and training information.

TA Q50 Thermogravimetric Analyzer (right figure)

The Q50 TGA is used for surface chemistry analysis of nanocrystals and molecules. The system has a dual ranage microbalance and a furnace which can heat samples up to 1000 degrees C.

The MRSEC also operates a facility for synthesizing nanocrystals by colloidal chemistry. Contact Professor Louis Brus for details.

Zetapotential and Particle Sizing Test Measurement System
Supervisor : Professor Irving Herman

The direct contact for this instrument is Austin Akey. Please contact him for scheduling and training information.

Malvern Zetasizer Nano-ZS Test Measurement System (right figure)

The Zetasizer Nano-ZS is used to measure the electrophoretic mobility distribution/ zeta potential of colloidal nanocrystals. It can also determine the size distribution of nanocrystals through means of light scattering.