MRSEC Shared Instrument Facility

This facility is located on the 10th floor of the Schapiro Center for Engineering and Physical Science Research (CEPSR). Larger instruments are in 10LE4 CEPSR. This facility is equipped with a spectroscopic ellipsometer, an x-ray diffractometer (for powder, small angle and reflectivity measurements), XPS/SIMS/ISS analysis system, and an atomic force microscope. The phone number in this lab is 212-854-0087. Next door, 10LE5 CEPSR, contains a wet station, a clean bench, a Fourier Transform Infrared (FTIR) Spectrometer, UV/VIS spectrophotometer, and a probe station.

 

Spectroscopic and Imaging Ellipsometer
Supervisors: Professors Irving P. Herman

The direct contact for this ellipsometer is Shengguo Jia at 212-854-6666. Please contact Lu Chen at 212-854-0260 for scheduling and training information.
The Beaglehole Spectroscopic and Imaging System can be configured and operated as an:

Configurations 1 and 2 can be mounted on dual arms for two simultaneous and independent set-ups or for operation as system 3.
 

 

X-ray Diffractometer
Supervisor : Professor Stephen O'Brien

The direct contacts for this instrument are Limin Huang at 212-854-9478. Please contact Lu Chen at 212-854-0260 for scheduling and training information.

Scintag X2 X-ray Diffractometer (right figure)
This is a Scintag Model X2, with powder diffraction, small angle diffraction, and reflectivity capability. It has a high temperature stage, which allows analysis up to 1600oC.



Supervisior: Professor Colin Nuckolls

The direct contact for this instrument is Michael Lefenfeld, at 212-854-8662 (lab). Please contact Lu Chen at 212-854-0260 for scheduling and training information.

Inel X-ray Diffractometer (right figure)
This diffractometer allows for instantaneous 120 degree (2-theta) detection of x-rays diffracted from substrates and powders, and has a capillary attachment and furnace for dynamic analysis of powder samples from 0 to 400 degrees C.

X-ray Photoelectron Spectrometer (XPS)
Supervisor: Professor Jeffrey Koberstein

Please contact Lu Chen for scheduling and training information

PHI 5500 ESCA (XPS)/ISS Spectrometer (right figure)
This is a PHI 5500 ESCA (XPS)/ISS system with a secondary ion mass spectrometer. It is capable of performing ESCA, ESCA mapping, ESCA depth profiling, static SIMS, and ISS, all under computer control. In the ESCA mode, the system can run multiple samples under automatic control. ESCA can be run in either the static mode (analysis of a fixed area) or in a mapping mode.

 

 

Atomic Force Microscope (AFM)
Supervisor : Professor Irving Herman

The direct contact for this instrument is Lu Chen at 212-854-0260. Please contact him for scheduling and training information.

ThermoMicroscopes Autoprobe CP Research System (right figure)

This is a ThermoMicroscopes Autoprobe CP Research System capable of contact, non-contact, intermittent contact, scanning tunneling microscopy, lateral force microscopy, phase imaging, electrostatic force microscopy and nanolithography modes.

This instrument is also capable of imaging samples under solution.

 

 

Fourier Transform Infrared (FTIR) Spectrometer
Supervisor : Professor Colin Nuckolls

The direct contact for this instrument is Mohamed Siaj at 212-854-8662 (lab). Please contact Lu Chen at 212-854-0260 for scheduling and training information.

Digilab/Biorad 7000 Fourier Transform Infrared (FTIR) Spectrometer (right figure)

This is a Digilab/Biorad 7000 FTIR spectrometer with an attachment for variable-angle infrared reflection absorption spectroscopy (IRRAS) using a photoelastic modulator (PEM) with an MCT detector, which can easily measure monolayers and also determine how transitions are polarized. It also has an attenuated total reflection (ATR) attachment.

 

 

Probe Station
Supervisor : Professor Irving Herman

The direct contact for this instrument is Lu Chen, who should also be contacted for scheduling and training information.

Signatone Probe Station (right figure)

The Signatone CM300 Probe Station is used for the electronic characterization of semiconductor devices. This particular unit includes 4 micropositioners, and a joystick control system that enables coarse and fine x-y translation of the scope and chuck. The Mitutoyo microscope allows viewing up to 1000x, and includes a frame grabber for capturing digital images. This system may also be used in conjunction with our Radiant Technology Ferroelectric Tester, which is overseen by Prof. Stephen O'Brien

 

 

UV/Visible Spectrophotometer
Supervisor : Professor Irving Herman

The direct contact for this instrument is Shengguo Jia at 212-854-6666. Please contact Lu Chen at 212-854-0260 for scheduling and training information.

HP 8453 UV/Visible Spectrophotometer (right figure)

The HP 8453 UV/Visible Spectrophotometer, by Agilent, is used for concentration analysis of molecular species in aqueous solutions. Transmission and absorbance spectra can be obtained from 190 nm in the UV, throughout the visible range, and up to 1100 nm in the near IR.

Thermogravimetric Analyzer
Supervisor : Professor Irving Herman

The direct contact for this instrument is Lu Chen at 212-854-0260. Please contact him for scheduling and training information.

TA Q50 Thermogravimetric Analyzer (right figure)

The Q50 TGA is used for surface chemistry analysis of nanocrystals and molecules. The system has a dual ranage microbalance and a furnace which can heat samples up to 1000 degrees C.

The MRSEC also operates a facility for synthesizing nanocrystals by colloidal chemistry. Contact Professor Louis Brus for details.

 

Zetapotential and Particle Sizing Test Measurement System
Supervisor : Professor Irving Herman

The direct contact for this instrument is Sarbajit Banerjee. Please contact him for scheduling and training information.

Malvern Zetasizer Nano-ZS Test Measurement System (right figure)

The Zetasizer Nano-ZS is used to measure the electrophoretic mobility distribution/ zeta potential of colloidal nanocrystals. It can also determine the size distribution of nanocrystals through means of light scattering.