X-ray
Diffractometers
Supervisor : Dr. Joze Bevk
The
direct contact for this instrument is Gen Satoh.
Please contact him for scheduling and
training information.
Scintag
X2 X-ray Diffractometer (right figure)
This is a Scintag Model X2, with powder diffraction, small angle
diffraction, and reflectivity capability. It has a high temperature
stage, which allows analysis up to 1600oC.
Inel X-ray Diffractometer (right figure)
This diffractometer allows for instantaneous 120 degree (2-theta) detection of x-rays diffracted from substrates and powders, and has a capillary attachment and furnace for dynamic analysis of powder samples from 0 to 400 degrees C.
X-ray
Photoelectron Spectrometer (XPS)
Supervisor: Professor Jeffrey Koberstein
Please
contact Benjamin Dach for scheduling and training
information
PHI
5500 ESCA (XPS)/ISS Spectrometer (right figure)
This is a PHI 5500 ESCA (XPS)/ISS system with a secondary ion
mass spectrometer. It is capable of performing ESCA, ESCA mapping,
ESCA depth profiling, static SIMS, and ISS, all under computer
control. In the ESCA mode, the system can run multiple samples
under automatic control. ESCA can be run in either the static
mode (analysis of a fixed area) or in a mapping mode.
Atomic
Force Microscope (AFM)
Supervisor : Professor Irving Herman
The
direct contact for this instrument is Damien Maillard. Please contact him
for scheduling and training information.
ThermoMicroscopes
Autoprobe CP Research System (right figure)
This is a ThermoMicroscopes Autoprobe CP Research System capable
of contact, non-contact, intermittent contact, scanning tunneling
microscopy, lateral force microscopy, phase imaging, electrostatic
force microscopy and nanolithography modes.
This instrument is also capable of imaging samples under solution.
Fourier
Transform Infrared (FTIR) Spectrometer
Supervisor : Professor Irving Herman
The
direct contact for this instrument is Theodore Kramer. Please contact him
for scheduling and training information.
Digilab/Biorad
7000 Fourier Transform Infrared (FTIR) Spectrometer (right figure)
This
is a Digilab/Biorad 7000 FTIR spectrometer with an attachment
for variable-angle infrared reflection absorption spectroscopy
(IRRAS) using a photoelastic modulator (PEM) with an MCT detector,
which can easily measure monolayers and also determine how transitions
are polarized. It also has an attenuated total reflection (ATR)
attachment.
Probe
Station
Supervisor : Professor Irving Herman
The
direct contact for this instrument is Austin Akey,
who should also be contacted for scheduling and training information.
Signatone
Probe Station (right figure)
The
Signatone CM300 Probe Station is used for the electronic characterization
of semiconductor devices. This particular unit includes 4 micropositioners,
and a joystick control system that enables coarse and fine x-y
translation of the scope and chuck. The Mitutoyo microscope allows
viewing up to 1000x, and includes a frame grabber for capturing
digital images. This system may also be used in conjunction with
our Radiant Technology Ferroelectric Tester.
UV/Visible Spectrophotometer
Supervisor : Professor Irving Herman
The
direct contact for this instrument is Theodore Kramer. Please contact him
for scheduling and training information.
HP
8453 UV/Visible Spectrophotometer (right figure)
The
HP 8453 UV/Visible Spectrophotometer, by Agilent, is used for
concentration analysis of molecular species in aqueous solutions.
Transmission and absorbance spectra can be obtained from 190 nm
in the UV, throughout the visible range, and up to 1100 nm in
the near IR.
Thermogravimetric Analyzer
Supervisor : Professor Irving Herman
The
direct contact for this instrument is Theodore Kramer. Please contact him
for scheduling and training information.
TA Q50 Thermogravimetric Analyzer (right figure)
The
Q50 TGA is used for surface chemistry analysis of nanocrystals and molecules. The system has a dual ranage microbalance and a furnace which can heat samples up to 1000 degrees C.
The
MRSEC also operates a facility for synthesizing nanocrystals by
colloidal chemistry. Contact Professor Louis Brus for details.
Zetapotential and Particle Sizing Test Measurement System
Supervisor : Professor Irving Herman
The direct contact for this instrument is Austin Akey. Please contact him for scheduling and training information.
Malvern Zetasizer Nano-ZS Test Measurement System (right figure)
The Zetasizer Nano-ZS is used to measure the electrophoretic mobility distribution/ zeta potential of colloidal nanocrystals. It can also determine the size distribution of nanocrystals through means of light scattering.