MRSEC Shared Instrument Facility

This facility is located on the 10th floor of the Schapiro Center for Engineering and Physical Science Research (CEPSR). Larger instruments are in 10LE4 CEPSR. This facility is equipped with a spectroscopic ellipsometer, an x-ray diffractometer (for powder, small angle and reflectivity measurements), XPS/SIMS/ISS analysis system, and an atomic force microscope. The phone number in this lab is 212-854-0087. Next door, 10LE5 CEPSR, contains a wet station, a clean bench, a Fourier Transform Infrared (FTIR) Spectrometer, UV/VIS spectrophotometer, and a probe station.

 

Spectroscopic and Imaging Ellipsometer
Supervisors: Professors Irving P. Herman and Rasti Levicky

The direct contact for this ellipsometer is Jay Dickerson at 212-854-6666. Please contact Nate Clark at 212-854-0260 for scheduling and training information.
The Beaglehole Spectroscopic and Imaging System can be configured and operated as an:

  1. Ellipsometer (picometer) in a single region, either monochromatically at 6328 A (He-Ne laser) (10-15 micron spot size) or spectroscopically from 200 - 1050 nm, at variable angle.
  2. Spectroscopic imaging ellipsometer over 2 mm x 2 mm to 1 cm x 1 cm with a spatial resolution of 3-5 microns, at variable angle.
  3. Image-enhanced ellipsometer - on dual arms with the picometer and imaging system used at the same time.
  4. Reflectance Difference Spectrometer (RDS).
  5. Reflectometer.
  6. Transmission or transmission ellipsometer. (Systems 1-3 are reflection ellipsometers.)
  7. Circular dichroism/birefringence instrument.
  8. Scatterometer, for dark field elastic scattering.

Configurations 1 and 2 can be mounted on dual arms for two simultaneous and independent set-ups or for operation as system 3.
 

 

X-ray Diffractometer
Supervisor : Professor Stephen O'Brien

The direct contacts for this instrument are Limin Huang and Ming Yin, both at 212-854-9478. Please contact Nate Clark at 212-854-0260 for scheduling and training information.

Scintag X2 X-ray Diffractometer (right figure)
This is a Scintag Model X2, with powder diffraction, small angle diffraction, and reflectivity capability. It has a high temperature stage, which allows analysis up to 1600oC.

 

 

X-ray Photoelectron Spectrometer (XPS)
Supervisor: Professor Jeffrey Koberstein

Please contact Nate Clark at 212-854-0260 for scheduling and training information

PHI 550 ESCA (XPS)/ISS Spectrometer (right figure)
This is a PHI 5500 ESCA (XPS)/ISS system with a secondary ion mass spectrometer. It is capable of performing ESCA, ESCA mapping, ESCA depth profiling, static SIMS, and ISS, all under computer control. In the ESCA mode, the system can run multiple samples under automatic control. ESCA can be run in either the static mode (analysis of a fixed area) or in a mapping mode.

 

 

Atomic Force Microscope (AFM)
Supervisor : Professor David Adams

The direct contact for this instrument is Mike_Holman at 212-854-1848 (lab). Please contact Nate Clark at 212-854-0260 for scheduling and training information.

ThermoMicroscopes Autoprobe CP Research System (right figure)

This is a ThermoMicroscopes Autoprobe CP Research System capable of contact, non-contact, intermittent contact, scanning tunneling microscopy, lateral force microscopy, phase imaging, electrostatic force microscopy and nanolithography modes.

 

 

Fourier Transform Infrared (FTIR) Spectrometer
Supervisor : Professor Colin Nuckolls

The direct contact for this instrument is Mark Bushey at mlb212@columbia.edu. Please contact Nate Clark at 212-854-0260 for scheduling and training information.

Digilab/Biorad 7000 Fourier Transform Infrared (FTIR) Spectrometer (right figure)

This is a Digilab/Biorad 7000 FTIR spectrometer with an attachment for variable-angle infrared reflection absorption spectroscopy (IRRAS) using a photoelastic modulator (PEM) with an MCT detector, which can easily measure monolayers and also determine how transitions are polarized. It also has an attenuated total reflection (ATR) attachment.

 

 

Probe Station
Supervisor : Professor Irving Herman

The direct contact for this instrument is Nate Clark, who should also be contacted for scheduling and training information.

Signatone Probe Station (right figure)

The Signatone CM300 Probe Station is used for the electronic characterization of semiconductor devices. This particular unit includes 4 micropositioners, and a joystick control system that enables coarse and fine x-y translation of the scope and chuck. The Mitutoyo microscope allows viewing up to 1000x, and includes a frame grabber for capturing digital images. This system may also be used in conjunction with our Radiant Technology Ferroelectric Tester, which is overseen by Prof. Stephen O'Brien

 

 

HP 8453 UV/Visible Spectrophotometer
Supervisor : Professor Irving Herman

The direct contact for this instrument is Shengguo Jia at 212-854-6666. Please contact Nate Clark at 212-854-0260 for scheduling and training information.

HP 8453 UV/Visible Spectrophotometer (right figure)

The HP 8453 UV/Visible Spectrophotometer, by Agilent, is used for concentration analysis of molecular species in aqueous solutions. Transmission and absorbance spectra can be obtained from 190 nm in the UV, throughout the visible range, and up to 1100 nm in the near IR.

The MRSEC also operates a facility for synthesizing nanocrystals by colloidal chemistry. Contact Professor Louis Brus for details.


 

 


 

 

 
 


Beaglehole Spectroscopic and
Imaging Ellipsometer

 

 

 

 

 

 


Scintag X2 X-ray Diffractometer


 


PHI 550 ESCA
(XPS) / ISS Spectrometer

 


 


Thermo Microscopes Autoprobe
CP Research System

 

 

 


Digilab/Biorad 7000 Fourier
Transform Infrared (FTIR)
Spectrometer

 

 

 


Signatone Probe Station

 

 

 

 


HP 8453 UV/Visible
Spectrophotometer